diff --git a/contributed_definitions/NXstress.nxdl.xml b/contributed_definitions/NXstress.nxdl.xml new file mode 100644 index 0000000000..c0d15816bb --- /dev/null +++ b/contributed_definitions/NXstress.nxdl.xml @@ -0,0 +1,483 @@ + + + + + + + Number of diffractogram channels. + + + Number of diffractograms. For example the number of energy-dispersive detectors or the number of azimuthal sections in an area detector. + + + Number of reflections. + + + Diffractogram X units. + + + Diffractogram Y units. + + + + Application definition for stress and strain analysis of crystalline material defined by the EASI-STRESS consortium (https://easi-stress.eu). + + When a crystal is loaded (applied or residual stress) its crystallographic parameters change. + + Stress and strain analysis calculates deformation (strain) and the associated force (stress) + from diffraction data. + + This application definition essentially standardizes the result of diffraction pattern analysis + from different types of diffraction experiments for the purpose of stress and strain analysis. + The analysis is typically some form of diffraction peak indexing and fitting. + The experiments are for example + + - energy-dispersive X-ray powder diffraction + - angular-dispersive X-ray powder diffraction + - angular-dispersive neutron powder diffraction + - time-of-flight (TOF) neutron powder diffraction. + + Sample and detector positions can be defined with :ref:`NXtransformations`. If you don't specify the direction of gravity + and the direction of the beam then the standard NeXus Coordinate System is used. + + + + + Official NeXus NXDL schema to which this file conforms + + + + + + + Extended title for the entry. + + + + Unique identifier for the experiment as defined + by the facility (e.g. DOI, proposal id, ...). + + + + Brief summary of the experiment, including key objectives. + + + + User or Data Acquisition defined identifier from which + the content of this application definition is derived. + + + + Brief summary of the collection, including grouping criteria. + + + + Unique identifier for the measurement, defined by the facility. + This could be for example the name of the technique(s). + + + + + + Name of the instrument. + + Short name for the instrument, perhaps the acronym. + + + + Zero or more of these groups describe the detectors used in the experiment. + + name/manufacturer/model/etc. information + + + + This is the distance to the previous component in the + instrument; most often the sample. The usage depends on the + nature of the detector: Most often it is the distance of the + detector assembly. But there are irregular detectors. In this + case the distance must be specified for each detector pixel. + + + + + + The axis on which the detector position depends may be stored + anywhere, but is normally stored in the NXtransformations + group within the NXdetector group. + + + + + This is the recommended location for detector goniometer + and other related axes. + + + + + + + + Defines the probed volume in the sample + + Defines the primary beam size in the vertical direction. + + + Defines the primary beam size in the horizontal direction. + + + + Defines the depth of the probe volume as determined by + detector collimators. + + + + + + + The axis on which the sample position depends may be stored + anywhere, but is normally stored in the NXtransformations + group within the NXsample group. + + + + + This is the recommended location for sample goniometer + and other related axes. + + + + + + + Zero or more groups to describe the data processing steps + to obtain the content of this application definition. + + + + + User description of the data acquisitions and/or data processing. + + + + + This group contains all diffraction peak parameters that could be needed for stress-strain calculations. + These parameters are derived from `/NXstress/ENTRY/peak_parameters-group`_ and additional metadata. + + + First Miller index. + + + + + + Second Miller index. + + + + + + Third Miller index. + + + + + + Crystal lattice systems (*cubic*, *hexagonal*, ...) + + + + + + Crystallographic space group (*Fm3m*, *Im3m*, ...) + + + + + + Name of the crystallographic phase (hematite, goethite, a-Al2O3, ...). + + + + + + + First component of the *normalized* scattering vector *Q*. + + + + + + Second component of the *normalized* scattering vector *Q*. + + + + + + Third component of the *normalized* scattering vector *Q*. + + + + + + + Scattering angle :math:`2\theta`. Is required when `/NXstress/ENTRY/peaks/energy-field`_ and `/NXstress/ENTRY/peaks/momentum_transfer-field`_ are missing. + + + + + + Is required when `/NXstress/ENTRY/peaks/scattering_angle-field`_ and `/NXstress/ENTRY/peaks/momentum_transfer-field`_ are missing. + + + + + + Length of the scattering vector *Q*. Is required when `/NXstress/ENTRY/peaks/energy-field`_ and `/NXstress/ENTRY/peaks/scattering_angle-field`_ are missing. + + + + + + + First component of the sample position. + + + + + + Second component of the sample position. + + + + + + Third component of the sample position. + + + + + + + + + This group contains all diffraction peak fit parameters. + This information is not required for stress-strain caluclations. + + + Diffraction peak profile. + + + + + + + + + + + + Diffraction peak position. + + + + + + Diffraction peak area. + + + + + + + Diffraction peak height. + + + + + + Diffraction peak full width at half maximum. + + + + + + + Left-side FWHM for split profiles. + + + + + + Right-side FWHM for split profiles. + + + + + + + - Voigt or Pseudo-Voigt: Lorentzian fraction + - Pearson VII: decay parameter + - Other profiles: not applicable + + + + + + + + Angle that define the position of the integrated sector in the diffraction cone + for angular-dispersive diffraction or the position of the detector for energy-dispersive + diffraction. + + + + + + + + + + This group contains all background fit parameters. + This information is not required for stress-strain caluclations. + + + + Diffraction background profile. Required when background parameters fields are present. + For example: ``linear``, ``5-degree polynomial`` + + + + Background parameter(s). For example a second-degree polynomial will have fields ``A0``, ``A1`` and ``A2``. + + + + + + The background area integrated over a confidence interval around the center (*0.95* by default). + + + + + + + Confidence interval from which the background counts are integrated. + For example *0.95* means that the background is integrated over the range in + which the integrated peak area is 95% of the total peak area. + + + + + + + Diffractogram with fit results in `/NXstress/ENTRY/peak_parameters-group`_ and `/NXstress/ENTRY/background_parameters-group`_. + This information is not required for stress-strain caluclations. + + + List of the two axes field names to be used by default. + + + + + One or more fields that contain the values for the **nD** dimension. + For example the azimuthal positions of different energy-dispersive detectors + or the average azimuth of different azimuthal sections on an area detector. + + + + + + + + + One or more fields that contain the values for the **nX** dimension. + For example: MCA channels, scattering angle \ :math:`2\theta` in degrees, + scattering vector length q in \ :math:`\mathrm{nm}^{-1}`, ... + + + + + + + + Default field name to be plotted. + + + + + + + List of additional field names to be plotted. + + + + Diffractogram counts (default signal) + + + + + + + + + + + + Diffractogram fit counts (auxiliary signal). + + + + + + + + + + + + Diffractogram background counts (auxiliary signal). + + + + + + + + + + + + Difference between diffractogram and fit (auxiliary signal). + + + + + + + + + + + + + + \ No newline at end of file