diff --git a/contributed_definitions/NXstress.nxdl.xml b/contributed_definitions/NXstress.nxdl.xml new file mode 100644 index 0000000000..49ad03628f --- /dev/null +++ b/contributed_definitions/NXstress.nxdl.xml @@ -0,0 +1,378 @@ + + + + + + + Number of diffractogram channels. + + + Number of diffractograms. For example the number of energy-dispersive detectors or the number of azimuthal sections in an area detector. + + + Number of reflections. + + + Diffractogram X units. + + + Diffractogram Y units. + + + + Application definition for stress and strain analysis of crystalline material defined by the EASI-STRESS consortium (https://easi-stress.eu). + + When a crystal is loaded (applied or residual stress) its crystallographic parameters change. + + Stress and strain analysis calculates deformation (strain) and the associated force (stress) + from diffraction data. + + This application definition essentially standardizes the result of diffraction pattern analysis + from different types of diffraction experiments for the purpose of stress and strain analysis. + The analysis is typically some form of diffraction peak indexing and fitting. + The experiments are for example + + - energy-dispersive X-ray powder diffraction + - angular-dispersive X-ray powder diffraction + - angular-dispersive neutron powder diffraction + - time-of-flight (TOF) neutron powder diffraction. + + + + + Official NeXus NXDL schema to which this file conforms + + + + + + + Extended title for the entry. + + + + Unique identifier for the experiment, + defined by the facility, + possibly linked to the proposals. + + + + Brief summary of the experiment, including key objectives. + + + User or Data Acquisition defined group of data. + + + Brief summary of the collection, including grouping criteria. + + + Unique identifier for the measurement, defined by the facility. + + + + + Name of the instrument. + + Short name for the instrument, perhaps the acronym. + + + + Zero or more of these groups describe the detectors used in the experiment. + + name/manufacturer/model/etc. information + + + + + + + This group contains all diffraction peak parameters that could be needed for stress-strain calculations. + These parameters are derived from `/NXstress/ENTRY/peak_parameters-group`_ and additional metadata. + + + First Miller index. + + + + + + Second Miller index. + + + + + + Third Miller index. + + + + + + Reference d-spacing for the *(hkl)* lattice planes. + + + + + + + First component of the *normalized* scattering vector *Q*. + + + + + + Second component of the *normalized* scattering vector *Q*. + + + + + + Third component of the *normalized* scattering vector *Q*. + + + + + + Scattering angle :math:`2\theta`. Is required when `/NXstress/ENTRY/peaks/energy-field`_ and `/NXstress/ENTRY/peaks/momentum_transfer-field`_ are missing. + + + + + + Is required when `/NXstress/ENTRY/peaks/scattering_angle-field`_ and `/NXstress/ENTRY/peaks/momentum_transfer-field`_ are missing. + + + + + + Length of the scattering vector *Q*. Is required when `/NXstress/ENTRY/peaks/energy-field`_ and `/NXstress/ENTRY/peaks/scattering_angle-field`_ are missing. + + + + + + + First component of the sample position. + + + + + + Second component of the sample position. + + + + + + Third component of the sample position. + + + + + + + + + This group contains all diffraction peak fit parameters. + This information is not required for stress-strain caluclations. + + + Diffraction peak profile. + + + + + + + + + + + + Diffraction peak position. + + + + + + Diffraction peak area. + + + + + + + Diffraction peak height. + + + + + + Diffraction peak full width at half maximum. + + + + + + + Left-side FWHM for split profiles. + + + + + + Right-side FWHM for split profiles. + + + + + + + - Voigt or Pseudo-Voigt: Lorentzian fraction + - Pearson VII: decay parameter + - Other profiles: not applicable + + + + + + + + + + This group contains all background fit parameters. + This information is not required for stress-strain caluclations. + + + + Diffraction background profile. Required when background parameters fields are present. + For example: ``linear``, ``5-degree polynomial`` + + + + Background parameter(s). For example a second-degree polynomial will have fields ``A0``, ``A1`` and ``A2``. + + + + + + The background area integrated over a confidence interval around the center (*0.95* by default). + + + + + + + Confidence interval from which the background counts are integrated. + For example *0.95* means that the background is integrated over the range in + which the integrated peak area is 95% of the total peak area. + + + + + + + Diffractogram with fit results in `/NXstress/ENTRY/peak_parameters-group`_ and `/NXstress/ENTRY/background_parameters-group`_. + This information is not required for stress-strain caluclations. + + + List of the two axes field names to be used by default. + + + + One or more fields that contain the values for the **nD** dimension. For example the azimuthal positions of different energy-dispersive detectors or the average azimuth of different azimuthal sections on an area detector. + + + + + + + One or more fields that contain the values for the **nX** dimension. For example: MCA channels, scattering angle \ :math:`2\theta` in degrees, scattering vector length q in \ :math:`\mathrm{nm}^{-1}`, ... + + + + + + + Default field name to be plotted. + + + + + + + List of additional field names to be plotted. + + + + Diffractogram counts (default signal) + + + + + + + + + + + + Diffractogram fit counts (auxiliary signal). + + + + + + + + + + + + Diffractogram background counts (auxiliary signal). + + + + + + + + + + + + Difference between diffractogram and fit (auxiliary signal). + + + + + + + + + + + + + + \ No newline at end of file