From eebc8ae784e7e45434afdf0079dd7fdb778735d7 Mon Sep 17 00:00:00 2001 From: woutdenolf Date: Thu, 24 Mar 2022 17:44:57 +0100 Subject: [PATCH] contribution for stress-strain analysis --- contributed_definitions/NXstress.nxdl.xml | 155 ++++++++++++++++++++++ 1 file changed, 155 insertions(+) create mode 100644 contributed_definitions/NXstress.nxdl.xml diff --git a/contributed_definitions/NXstress.nxdl.xml b/contributed_definitions/NXstress.nxdl.xml new file mode 100644 index 0000000000..981c88cfab --- /dev/null +++ b/contributed_definitions/NXstress.nxdl.xml @@ -0,0 +1,155 @@ + + + + + + + Number of diffractogram channels + + + Number of reflections + + + + Application definition for stress and strain analysis defined in the scope of the EASI-STRESS project (https://easi-stress.eu). + + When a crystal is loaded (applied or residual stress) its crystallographic parameters change. + + Stress and strain analysis calculates deformation (strain) and the associated force (stress) from diffraction data. + + This application definition is based on reflections and their properties as derived from different types of diffraction experiments. + + + + + Official NeXus NXDL schema to which this file conforms + + + + + + + Extended title for entry + + + + Unique identifier for the experiment, + defined by the facility, + possibly linked to the proposals + + + + Brief summary of the experiment, including key objectives. + + + User or Data Acquisition defined group of data. + + + Brief summary of the collection, including grouping criteria. + + + Unique identifier for the measurement, defined by the facility. + + + + + Name of instrument + + short name for instrument, perhaps the acronym + + + + + name/manufacturer/model/etc. information + + + + + + At least one of these groups need to be present. It contains the result of a diffractogram fit. + + + + + + + + + + + + + Diffractogram channels + + + + + + Diffractogram counts (default signal) + + + + + + Diffractogram fit counts (auxiliary signal) + + + + + + Diffractogram background counts (auxiliary signal) + + + + + + Difference between diffractogram and fit (auxiliary signal) + + + + + + + + This group contains all reflection parameters derived from diffractogram fitting and other data. + + First Miller index + + + + + + Second Miller index + + + + + + Third Miller index + + + + + + + \ No newline at end of file