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Test description formatting changes (#391)
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Signed-off-by: Rajat Goyal <rajat.goyal@arm.com>
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rajatgoyal47 authored Sep 19, 2023
1 parent 1d7296b commit 7124eb0
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Showing 3 changed files with 3 additions and 3 deletions.
2 changes: 1 addition & 1 deletion test_pool/exerciser/operating_system/test_e005.c
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#include "val/include/sbsa_avs_exerciser.h"

#define TEST_NUM (AVS_EXERCISER_TEST_NUM_BASE + 5)
#define TEST_DESC "PE 2/4/8B writes tp PCIe as 2/4/8B"
#define TEST_DESC "PE 2/4/8B writes to PCIe as 2/4/8B"
#define TEST_RULE "S_PCIe_03"

static uint32_t transaction_size = 4;
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2 changes: 1 addition & 1 deletion test_pool/pcie/operating_system/test_p024.c
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Expand Up @@ -21,7 +21,7 @@
#include "test_p024_data.h"

#define TEST_NUM (AVS_PCIE_TEST_NUM_BASE + 24)
#define TEST_DESC "Check Device capabilites reg rules"
#define TEST_DESC "Check Device capabilities reg rule"
#define TEST_RULE "RE_REG_3, RE_REC_1, IE_REG_2, IE_REG_4"

static
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2 changes: 1 addition & 1 deletion test_pool/pcie/operating_system/test_p039.c
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#include "val/include/sbsa_avs_memory.h"

#define TEST_NUM (AVS_PCIE_TEST_NUM_BASE + 39)
#define TEST_DESC "Check i-EP atomicop rule "
#define TEST_DESC "Check i-EP AtomicOp rule "
#define TEST_RULE "IE_REG_2"

static
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