adding assert failure messages

TESTS/API/AnalogOut/AnalogOut.cpp

@@ -1,54 +1,54 @@
-#include "mbed.h"
-#include "greentea-client/test_env.h"
-#include "unity.h"
-#include "utest.h"
-#include "rtos.h"
-
-using namespace utest::v1;
-
-// Template to set one Analog pin as input and then cycle through the rest as outputs.
-// As you turn more pins on the voltage on the ain pin will go up.
-template <PinName aout_pin, PinName ain_pin> 
-void AnalogOutput_Test()
-{
-    AnalogIn ain(ain_pin);
-    AnalogOut aout(aout_pin);
-    float valueOff = 0;
-    float valueOn = 0;
-    aout = 0;
-    valueOff = ain.read();
-    aout = 0.5;
-    valueOn = ain.read();
-    printf("***** valueOff = %f, valueOn = %f \n",valueOff, valueOn);
-    TEST_ASSERT(valueOn > valueOff);
-    valueOff = ain.read();
-    aout = 1.0;
-    valueOn = ain.read();
-    printf("***** valueOff = %f, valueOn = %f \n",valueOff, valueOn);
-    TEST_ASSERT(valueOn > valueOff);
-}
-
-utest::v1::status_t test_setup(const size_t number_of_cases) {
-    // Setup Greentea using a reasonable timeout in seconds
-    GREENTEA_SETUP(30, "default_auto");
-    return verbose_test_setup_handler(number_of_cases);
-}
-
-// Handle test failures, keep testing, dont stop
-utest::v1::status_t greentea_failure_handler(const Case *const source, const failure_t reason) {
-    greentea_case_failure_abort_handler(source, reason);
-    return STATUS_CONTINUE;
-}
-
-// Test cases
-// TODO: take input based on pinmap
-Case cases[] = {
-    Case("Test Analog Output on A5", AnalogOutput_Test<A5,A0>,greentea_failure_handler),
-};
-
-Specification specification(test_setup, cases);
-
-// Entry point into the tests
-int main() {
-    return !Harness::run(specification);
-}
+#include "mbed.h"
+#include "greentea-client/test_env.h"
+#include "unity.h"
+#include "utest.h"
+#include "rtos.h"
+
+using namespace utest::v1;
+
+// Template to set one Analog pin as input and then cycle through the rest as outputs.
+// As you turn more pins on the voltage on the ain pin will go up.
+template <PinName aout_pin, PinName ain_pin> 
+void AnalogOutput_Test()
+{
+    AnalogIn ain(ain_pin);
+    AnalogOut aout(aout_pin);
+    float valueOff = 0;
+    float valueOn = 0;
+    aout = 0;
+    valueOff = ain.read();
+    aout = 0.5;
+    valueOn = ain.read();
+    printf("***** valueOff = %f, valueOn = %f \n",valueOff, valueOn);
+    TEST_ASSERT(valueOn > valueOff);
+    valueOff = ain.read();
+    aout = 1.0;
+    valueOn = ain.read();
+    printf("***** valueOff = %f, valueOn = %f \n",valueOff, valueOn);
+    TEST_ASSERT(valueOn > valueOff);
+}
+
+utest::v1::status_t test_setup(const size_t number_of_cases) {
+    // Setup Greentea using a reasonable timeout in seconds
+    GREENTEA_SETUP(30, "default_auto");
+    return verbose_test_setup_handler(number_of_cases);
+}
+
+// Handle test failures, keep testing, dont stop
+utest::v1::status_t greentea_failure_handler(const Case *const source, const failure_t reason) {
+    greentea_case_failure_abort_handler(source, reason);
+    return STATUS_CONTINUE;
+}
+
+// Test cases
+// TODO: take input based on pinmap
+Case cases[] = {
+    Case("Test Analog Output on A5", AnalogOutput_Test<A5,A0>,greentea_failure_handler),
+};
+
+Specification specification(test_setup, cases);
+
+// Entry point into the tests
+int main() {
+    return !Harness::run(specification);
+}

TESTS/API/SPI/SPI.cpp

@@ -24,7 +24,7 @@
 
 void test_sd_write(){
 	// Currently no SD Test written, waiting for public release to enable
-	TEST_ASSERT(false);
+	TEST_ASSERT_MESSAGE(false,"SD Tests are not supported yet, this is a placeholder for future tests.");
 }
 
 utest::v1::status_t test_setup(const size_t number_of_cases) {

TESTS/API/UART/UART.cpp

@@ -20,12 +20,11 @@ void test_uart_single(){
 	TEST_ASSERT(UART_SENTINAL == value);
 	if(UART_SENTINAL == value){
 	//	printf("Test Finished Successfully!\n");
-		TEST_ASSERT(true);
+		TEST_ASSERT_MESSAGE(true,"characters match!");
 	} else{
 	//	printf("Test Failed! \n");
-		TEST_ASSERT(false);
+		TEST_ASSERT_MESSAGE(false,"characters do not match, possible corruption?");
 	}
-	TEST_ASSERT(true);
 }
 
 // TODO: add more verbose tests