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rename diffraction_type to processing_type, use enumeration and add m…
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…ore descriptions
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woutdenolf committed May 8, 2024
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40 changes: 34 additions & 6 deletions contributed_definitions/NXstress.nxdl.xml
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Brief summary of the collection, including grouping criteria. The information provided in this field can highlight, for example, the measurement setup or information about experimental conditions.
</doc>
</field>
<field name="diffraction_type" type="NX_CHAR" optional="false">
<doc> This variable describes the type of data plotted in the diffractogram and describes the type of calculation used in the EASI-STRESS software. Any of these values are valid:
* ``two-theta``
* ``energy``
* ``d-spacing``
* ``sin2psi``
<field name="processing_type" type="NX_CHAR" optional="false">
<doc>
Describes the way strain `\varepsilon ` can be calculated from the :ref:`center &lt;/NXstress/ENTRY/peaks/center-field&gt;`
peak parameter.
</doc>
<enumeration>
<item value="two-theta">
<doc>
\ :math:`\varepsilon = \large \frac{sin(\mathrm{\theta}_{0})}{sin(\mathrm{\theta})}-1`
</doc>
</item>
<item value="energy">
<doc>
\ :math:`\varepsilon = \large \frac{\mathrm{E}_{0}}{\mathrm{E}}-1`
</doc>
</item>
<item value="d-spacing">
<doc>
\ :math:`\varepsilon = \large \frac{\mathrm{d}}{\mathrm{d}_{0}}-1`
</doc>
</item>
<item value="time-of-flight">
<doc>
\ :math:`\varepsilon = \large \frac{\mathrm{TOF}}{\mathrm{TOF}_{0}}-1`
</doc>
</item>
<item value="sin2psi">
<doc>
A description of the \ :math:`\mathrm{\sin}^{2}\psi` method can be found in the literature. Two examples are:
`Fitzpatrick, M. E. et. al.; Determination of residual stresses by X-ray diffraction; National Physical Laboratory, Teddington, 2005`
and
`EN 15305:2009 standard: Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction`.
</doc>
</item>
</enumeration>
</field>
<field name="measurement_direction" type="NX_CHAR" optional="true">
<doc>
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